Atomic Force Microscope (AFM)
Make: Oxford Instrument (Asylum Research)
Model: MFP3D-Origin
Year of Installation: 2023
Specifications
- Standard X and Y range 120 μm X and Y sensors <0.6 nm noise Z range >15 μm
- Z sensor <0.25 nm noise
- Igor Pro software analysis
- Sample size Up to 80 mm diameter Sample thickness Up to 10 mm (up to 27 mm option)
Operational Modes
- Contact mode
- Tapping mode
- Piezoelectric Force Microscopy Mode
Applications
Soft and hard material characterizations include thin films, nanoparticles, nanotubes, conductive polymers, bio-conjugates, viruses, ferroelectric and piezoelectric materials etc.
User Instruction:
- Must submit the requisition
- External users should apply through
AFM charges:
Imaging:
Govt. and private academic institutions: INR 1000+18% GST
Industry: INR 1500 +18% GST
PFM:
Govt. and private academic institutions: INR 1500+18% GST
Industry: INR 2500 +18% GST
*sample should be deposited on a substrate and dried properly
Location
Shiv Nadar IoE Campus
Contact Person