Surface Characterization Laboratory

Scanning Probe Microscopy (SPM) is a powerful tool for imaging a specimen surface by scanning with a physical probe. It operates in two basic ways: (i) contact and (ii) non-contact of the probe with a surface to be studied. They are of various types based on the physical processes involved in surface imaging. Some of them are Atomic Force Microscopy (AFM), Conductive-AFM (c-AFM), Piezo-response Force Microscopy (PFM), Electrostatic Force Microscopy (EFM), and Magnetic Force Microscopy (MFM).

Scanning Probe Microscopy (SPM) is a powerful tool for imaging a specimen surface by scanning with a physical probe. It operates in two basic ways: (i) contact and (ii) non-contact of the probe with a surface to be studied. They are of various types based on the physical processes involved in surface imaging. Some of them are Atomic Force Microscopy (AFM), Conductive-AFM (c-AFM), Piezo-response Force Microscopy (PFM), Electrostatic Force Microscopy (EFM), and Magnetic Force Microscopy (MFM).

Probing Surface Morphology

AFM: Determining surface morphology.

c-AFM: Mapping current on a material surface.

PFM: Analysing piezoelectric/ferroelectric domains.

EFM: Mapping surface electric properties.

MFM: Determining surface magnetic domains.

Location

Ground Floor, Room: R003A

Contact Person

6734